CDM tests on interface test chips for the verification of ESD protection concepts
Autor: | Brodbeck, Tilo, Esmark, Kai, Stadler, Wolfgang |
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Zdroj: | In Microelectronics Reliability 2009 49(12):1470-1475 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Brodbeck, Tilo, Esmark, Kai, Stadler, Wolfgang |
---|---|
Zdroj: | In Microelectronics Reliability 2009 49(12):1470-1475 |
Databáze: | ScienceDirect |
Externí odkaz: |