Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress
| Autor: | Galy, Ph., Dudit, S., Vallet, M., Richier, C., Entringer, C., Jezequel, F., Petit, E., Beltritti, J. |
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| Zdroj: | In Microelectronics Reliability 2009 49(9):1107-1110 |
| Databáze: | ScienceDirect |
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