Estimation of SiC JFET temperature during short-circuit operations
| Autor: | Berkani, Mounira, Lefebvre, Stéphane, Boughrara, Narjes, Khatir, Zoubir, Faugières, Jean-Claude, Friedrichs, Peter, Haddouche, Ali |
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| Zdroj: | In Microelectronics Reliability 2009 49(9):1358-1362 |
| Databáze: | ScienceDirect |
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