A low-frequency noise model for advanced gate-stack MOSFETs

Autor: Çelik-Butler, Zeynep, Devireddy, Siva Prasad, Tseng, Hsing-Huang, Tobin, Philip, Zlotnicka, Ania
Zdroj: In Microelectronics Reliability 2009 49(2):103-112
Databáze: ScienceDirect
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