New concepts of worst-case delay and yield estimation in asynchronous VLSI circuits
| Autor: | Sokolović, Miljana, Litovski, Vančo, Zwolinski, Mark |
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| Zdroj: | In Microelectronics Reliability 2009 49(2):186-198 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Sokolović, Miljana, Litovski, Vančo, Zwolinski, Mark |
|---|---|
| Zdroj: | In Microelectronics Reliability 2009 49(2):186-198 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect