Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation
| Autor: | Deshayes, Y., Bord, I., Barreau, G., Aiche, M., Moretto, P.H., Béchou, L., Roehrig, A.C., Ousten, Y. |
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| Zdroj: | In Microelectronics Reliability 2008 48(8):1354-1360 |
| Databáze: | ScienceDirect |
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