ESD failure signature in capacitive RF MEMS switches
| Autor: | Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., Plana, R. |
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| Zdroj: | In Microelectronics Reliability 2008 48(8):1237-1240 |
| Databáze: | ScienceDirect |
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| Autor: | Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., Plana, R. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2008 48(8):1237-1240 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect