Negative bias temperature instability in n-channel power VDMOSFETs
| Autor: | Danković, D., Manić, I., Davidović, V., Djorić-Veljković, S., Golubović, S., Stojadinović, N. |
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| Zdroj: | In Microelectronics Reliability 2008 48(8):1313-1317 |
| Databáze: | ScienceDirect |
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