Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices
| Autor: | Marchut, Leslie, Whitman, Charles S. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2008 48(7):990-993 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Marchut, Leslie, Whitman, Charles S. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2008 48(7):990-993 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect