TLP Characterization of large gate width devices
| Autor: | Coppens, P., Jenicot, G., Casier, H., De Pestel, F., Depuydt, F., Martens, N., Moens, P. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2007 47(9):1462-1467 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Coppens, P., Jenicot, G., Casier, H., De Pestel, F., Depuydt, F., Martens, N., Moens, P. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2007 47(9):1462-1467 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect