Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices
| Autor: | Heer, M., Bychikhin, S., Mamanee, W., Pogany, D., Heid, A., Grombach, P., Klaussner, M., Soppa, W., Ramler, B. |
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| Zdroj: | In Microelectronics Reliability 2007 47(9):1450-1455 |
| Databáze: | ScienceDirect |
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