Correlation between infrared transmission spectra and the interface trap density of SiO 2 films
| Autor: | Vamvakas, V.Em., Theodoropoulou, M., Georga, S.N., Krontiras, C.A., Pisanias, M.N. |
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| Zdroj: | In Microelectronics Reliability 2007 47(4):834-837 |
| Databáze: | ScienceDirect |
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