VSP – A gate stack analyzer
| Autor: | Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Goes, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. |
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| Zdroj: | In Microelectronics Reliability 2007 47(4):704-708 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect