New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
| Autor: | Lee, In Kyung, Na Yun, Se Re, Kim, Kyo Sun, Yu, Chong Gun, Park, Jong Tae |
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| Zdroj: | In Microelectronics Reliability 2006 46(9):1864-1867 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect