Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications
| Autor: | van der Wel, P.J., Theeuwen, S.J.C.H., Bielen, J.A., Li, Y., van den Heuvel, R.A., Gommans, J.G., van Rijs, F., Bron, P., Peuscher, H.J.F. |
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| Zdroj: | In Microelectronics Reliability 2006 46(8):1279-1284 |
| Databáze: | ScienceDirect |
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