Reliability of large periphery GaN-on-Si HFETs
| Autor: | Singhal, S., Li, T., Chaudhari, A., Hanson, A.W., Therrien, R., Johnson, J.W., Nagy, W., Marquart, J., Rajagopal, P., Roberts, J.C., Piner, E.L., Kizilyalli, I.C., Linthicum, K.J. |
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| Zdroj: | In Microelectronics Reliability 2006 46(8):1247-1253 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect