Gate oxide failures due to anomalous stress from HBM ESD testers
| Autor: | Duvvury, Charvaka, Steinhoff, Robert, Boselli, Gianluca, Reddy, Vijay, Kunz, Hans, Marum, Steve, Cline, Roger |
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| Zdroj: | In Microelectronics Reliability 2006 46(5):656-665 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect