Comparative analysis of accelerated ageing effects on power RF LDMOS reliability
| Autor: | Belaïd, M.A., Ketata, K., Mourgues, K., Maanane, H., Masmoudi, M., Marcon, J. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2005 45(9):1732-1737 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect