Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue
| Autor: | Khong, B. a, Tounsi, P. b, Dupuy, Ph. c, Chauffleur, X. d, Legros, M a, Deram, A. c, Levade, C. a, Vanderschaeve, G. a, Dorkel, J.-M. b, Fradin, J.-P. d |
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| Zdroj: | In Microelectronics Reliability 2005 45(9):1717-1722 |
| Databáze: | ScienceDirect |
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