Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies

Autor:	Boselli, G., Duvvury, C.
Zdroj:	In Microelectronics Reliability 2005 45(9):1406-1414
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect