Negative bias temperature instability mechanisms in p-channel power VDMOSFETs
| Autor: | Stojadinović, N., Danković, D., Djorić-Veljković, S., Davidović, V., Manić, I., Golubović, S. |
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| Zdroj: | In Microelectronics Reliability 2005 45(9):1343-1348 |
| Databáze: | ScienceDirect |
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