Effects of hot carriers in offset gated polysilicon thin-film transistors
| Autor: | Hatzopoulos, A.T., Tassis, D.H., Arpatzanis, N., Dimitriadis, C.A., Kamarinos, G. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2006 46(2):311-316 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect