PMOS NBTI-induced circuit mismatch in advanced technologies
| Autor: | Agostinelli, M., Lau, S., Pae, S., Marzolf, P., Muthali, H., Jacobs, S. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2006 46(1):63-68 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Agostinelli, M., Lau, S., Pae, S., Marzolf, P., Muthali, H., Jacobs, S. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2006 46(1):63-68 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect