Impact of interface and bulk trapped charges on transistor reliability
| Autor: | Ghidini, G., Langenbuch, M., Bottini, R., Brazzelli, D., Ghetti, A., Galbiati, N., Giusto, G., Garavaglia, A. |
|---|---|
| Zdroj: | In Microelectronics Reliability 2005 45(5):857-860 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect