Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown
| Autor: | Ribes, G. *, Bruyère, S., Denais, M., Roy, D., Ghibaudo, G. |
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| Zdroj: | In Microelectronics Reliability 2005 45(5):841-844 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect