The impact of PMOST bias-temperature degradation on logic circuit reliability performance
| Autor: | Lee, Yung-Huei, Jacobs, Steve, Stadler, Stefan, Mielke, Neal, Nachman, Ramez |
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| Zdroj: | In Microelectronics Reliability 2005 45(1):107-114 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect