Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits
| Autor: | Schlünder, Christian, Brederlow, Ralf, Ankele, Benno, Gustin, Wolfgang, Goser, Karl, Thewes, Roland |
|---|---|
| Zdroj: | In Microelectronics Reliability 2005 45(1):39-46 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect