High abstraction level permutational ESD concept analysis
| Autor: | Streibl, M., Zängl, F., Esmark, K., Schwencker, R., Stadler, W., Gossner, H., Drüen, S., Schmitt-Landsiedel, D. |
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| Zdroj: | In Microelectronics Reliability 2005 45(2):313-321 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect