Reliability and performance scaling of very high speed SiGe HBTs

Autor:	Freeman, Greg, Rieh, Jae-Sung, Yang, Zhijian, Guarin, Fernando
Zdroj:	In Microelectronics Reliability 2004 44(3):397-410
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect