From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
| Autor: | Beaudoin, F., Desplats, R., Perdu, P., Firiti, Abdellatif, Haller, G., Pouget, V., Lewis, D. |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1681-1686 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect