Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.
| Autor: | Dilhaire, Stefan, Salhi, Amine, Grauby, Stéphane, Claeys, Wilfrid |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1609-1613 |
| Databáze: | ScienceDirect |
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