Short defect characterization based on TCR parameter extraction
| Autor: | Firiti, A., Faujour, D., Haller, G., Moragues, J.M., Goubier, V., Perdu, P., Beaudoin, F., Lewis, D. |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1563-1568 |
| Databáze: | ScienceDirect |
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