Charging induced damage by photoconduction through thick inter metal dielectrics
| Autor: | Ackaert, Jan, Bessemans, Klara, De Backer, Eddy |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1525-1529 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ackaert, Jan, Bessemans, Klara, De Backer, Eddy |
|---|---|
| Zdroj: | In Microelectronics Reliability 2003 43(9):1525-1529 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect