The right way to assess electronic system reliability: FIDES
| Autor: | Charpenel, P., Davenel, F., Digout, R., Giraudeau, M., Glade, M., Guerveno, JP., Guillet, N., Lauriac, A., Male, S., Manteigas, D., Meister, R., Moreau, E., Perie, D., Relmy-Madinska, F., Retailleau, P. |
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| Zdroj: | In Microelectronics Reliability 2003 43(9):1401-1404 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect