New insights into the change of voltage acceleration and temperature activation of oxide breakdown
| Autor: | Ribes, G., Bruyère, S., Monsieur, F., Roy, D., Huard, V. |
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| Zdroj: | In Microelectronics Reliability 2003 43(8):1211-1214 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect