Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies
| Autor: | Streibl, M., Esmark, K., Sieck, A., Stadler, W., Wendel, M., Szatkowski, J., Goßner, H. |
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| Zdroj: | In Microelectronics Reliability 2003 43(7):1001-1010 |
| Databáze: | ScienceDirect |
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