Erratum to “A simple and fundamental design rule for resisting delamination in bimaterial structures” [Microelectronics Reliability 2003;43:487–494]
| Autor: | Moore, Thomas D., Jarvis, John L. |
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| Zdroj: | In Microelectronics Reliability 2003 43(7):1169-1169 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect