Passivation and packaging of positive bevelled edge termination and related electrical stability
| Autor: | Hidalgo, S, Flores, D, Obieta, I, Mazarredo, I |
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| Zdroj: | In Microelectronics Reliability 2003 43(3):413-420 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Hidalgo, S, Flores, D, Obieta, I, Mazarredo, I |
|---|---|
| Zdroj: | In Microelectronics Reliability 2003 43(3):413-420 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect