Fast thermal fatigue on top metal layer of power devices
| Autor: | Russo, Sebastiano, Letor, Romeo, Viscuso, Orazio, Torrisi, Lucia, Vitali, Gianluigi |
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| Zdroj: | In Microelectronics Reliability 2002 42(9):1617-1622 |
| Databáze: | ScienceDirect |
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| Autor: | Russo, Sebastiano, Letor, Romeo, Viscuso, Orazio, Torrisi, Lucia, Vitali, Gianluigi |
|---|---|
| Zdroj: | In Microelectronics Reliability 2002 42(9):1617-1622 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect