Device Simulation and Backside Laser Interferometry––Powerful Tools for ESD Protection Development
| Autor: | Stadler, W., Esmark, K., Gossner, H., Streibl, M., Wendel, M., Fichtner, W., Pogany, D., Litzenberger, M., Gornik, E. |
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| Zdroj: | In Microelectronics Reliability 2002 42(9):1267-1274 |
| Databáze: | ScienceDirect |
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