Hierarchical test generation for combinational circuits with real defects coverage
| Autor: | Cibáková, T, Fischerová, M, Gramatová, E, Kuzmicz, W, Pleskacz, W.A, Raik, J, Ubar, R |
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| Zdroj: | In Microelectronics Reliability 2002 42(7):1141-1149 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect