Development of substrate-pumped nMOS protection for a 0.13 μm technology

Autor:	Salling, Craig, Hu, Jerry, Wu, Jeff, Duvvury, Charvaka, Cline, Roger, Pok, Rith
Zdroj:	In Microelectronics Reliability 2002 42(6):887-899
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect