Statistical modeling of MOS devices for parametric yield prediction
| Autor: | Liou, Juin J. a, b, ∗, Zhang, Qiang a, McMacken, John c, Thomson, J.Ross c, Stiles, Kevin c, Layman, Paul c |
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| Zdroj: | In Microelectronics Reliability 2002 42(4):787-795 |
| Databáze: | ScienceDirect |
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