Impact of the As dose in [formula omitted]m EEPROM technology: characterization and modeling

Autor:	Galbiati, N., Ghidini, G., Cremonesi, C., Larcher, L.
Zdroj:	In Microelectronics Reliability 2001 41(7):999-1002
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect