Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors
| Autor: | Golan, G *, Rabinovich, E, Inberg, A, Axelevitch, A, Lubarsky, G, Rancoita, P.G, Demarchi, M, Seidman, A, Croitoru, N |
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| Zdroj: | In Microelectronics Reliability 2001 41(1):67-72 |
| Databáze: | ScienceDirect |
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