Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device
| Autor: | Heiderhoff, R., Palaniappan, M., Phang, J.C.H., Balk, L.J. |
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| Zdroj: | In Microelectronics Reliability August-October 2000 40(8-10):1383-1388 |
| Databáze: | ScienceDirect |
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