Relation between robustness against ESD and against flash events in deflection amplifiers
| Autor: | van Roijen, R., Ludikhuize, A.W., Voets, J., van Oosten, P. |
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| Zdroj: | In Microelectronics Reliability August-October 2000 40(8-10):1263-1266 |
| Databáze: | ScienceDirect |
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