1/ f phase noise in a transistor and its application to reduce the frequency fluctuation in an oscillator
Autor: | Takagi, Keiji, Serikawa, Seiichi *, Okuno, Atsushi |
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Zdroj: | In Microelectronics Reliability 2000 40(11):1943-1950 |
Databáze: | ScienceDirect |
Externí odkaz: |