Modelling of submicronic MOSFET's ageing effects using spice
| Autor: | Djahli, F. *, Bouchemat, M., Kahouadji, M. |
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| Zdroj: | In Microelectronics Journal May 2000 31(5):333-337 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Djahli, F. *, Bouchemat, M., Kahouadji, M. |
|---|---|
| Zdroj: | In Microelectronics Journal May 2000 31(5):333-337 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
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