Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology
| Autor: | Zhang, Chenyu, Li, Yan, Zhan, Wenfa, Geng, Wenping, Liang, Ting, Zeng, Xiaoyang |
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| Zdroj: | In Microelectronics Journal January 2024 143 |
| Databáze: | ScienceDirect |
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